Test equipment

Results: 3816



#Item
951Electronic engineering / Electronic design / Breadboard / Electronic test equipment / Electronics manufacturing / Electronic circuit / Tangible user interface / Prototype / Usability / Electronics / Technology / Electromagnetism

IDC[removed]DEMOS 20th-23rd June, Ann Arbor, USA

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Source URL: www.blikstein.com

Language: English - Date: 2011-09-04 02:06:41
952Measuring instruments / Engineering / Metrology / Electronic test equipment / Multimeter / Calibration / Heat flux sensor / Thermometer / Resistor / Technology / Measurement / Sensors

Microsoft Word - paperTECO2010_bloemink_bijma.doc

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Source URL: www.wmo.int

Language: English - Date: 2010-10-01 03:49:56
953Mortgage industry of the United States / Loans / Association of Commonwealth Universities / Curtin University

SCHOOL OF PSYCHOLOGY AND SPEECH PATHOLOGY TEST LIBRARY TERMS AND CONDITIONS OF BORROWING Student Borrowers General conditions: 1. All materials and equipment will remain the property of Curtin University, Kent Street Ben

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Source URL: healthsciences.curtin.edu.au

Language: English - Date: 2015-04-10 03:06:59
954TTCN / High-Speed Uplink Packet Access / PDCP / General Packet Radio Service / Rel / European Telecommunications Standards Institute / Multimedia Broadcast Multicast Service / GERAN / Software-defined radio / Universal Mobile Telecommunications System / 3GPP

TS[removed]V11[removed]Universal Mobile Telecommunications System (UMTS); User Equipment (UE) conformance specification; Part 3: Abstract test suite (ATS) (3GPP TS[removed]version[removed]Release 11)

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Source URL: www.etsi.org

Language: English - Date: 2015-03-17 08:19:57
955Time scales / Horology / Electronic test equipment / Atomic clock / Second / Gravitational redshift / International Atomic Time / Frequency standard / Frequency / Measurement / Clocks / SI base units

5-6 Applied Researches in T & F Fields[removed]The Detection of Gravitational Red Shift by Transportation of Atomic Clocks KOTAKE Noboru, SHIMIZU Yoshiyuki, IMAMURA Kuniyasu, KANEKO Akihiro, KURIHARA Noriyuki, and HOSOKAWA

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Source URL: www.nict.go.jp

Language: English - Date: 2013-11-20 21:45:44
956X Window System / Computer network security / Electronic test equipment / Software / Computer / Computing

Hong Kong Examinations and Assessment Authority Hong Kong Certificate of Education Examination 2008 Computer and Information Technology Paper 3 (Coursework) Module A (Algorithm and Programming): Composition Analyzer A co

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Source URL: www.ilc.edu.hk

Language: English - Date: 2007-10-09 03:10:54
957Office equipment / Windows XP / IBM PC compatibles / Personal computers / Windows Vista / Laser printer / Windows / Printer / Laptop / Computing / Computer architecture / Microsoft Windows

CompTIA A+ 2007 Essentials[removed]Practice Test 1 The CompTIA A+ Essential s[removed]test covers all basic PC hardware and software aspects at an introductory level. The secrete to successfully passing the Essential

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Source URL: www.rmroberts.com

Language: English - Date: 2008-11-03 12:32:44
958Technology / Radio technology / Signal processing / Radiation / Electronic test equipment / Electromagnetic interference / Comité International Spécial des Perturbations Radioélectriques / Spectrum analyzer / Anechoic chamber / Telecommunications engineering / Electromagnetic compatibility / Electromagnetism

5 Electromagnetic Environment 5-1 Recent Progress of Studies on EMC Relating to Various Equipment Yukio YAMANAKA, Shinobu ISHIGAMI, and Katsushige HARIMA In order to realize the further development of the advanced inform

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Source URL: www.nict.go.jp

Language: English - Date: 2013-11-20 20:59:01
959Optics / Photonics / OICETS / Free-space optical communication / Adaptive optics / Optical communication / Communications satellite / Japan Aerospace Exploration Agency / Laser / Spaceflight / Japanese space program / Technology

3-3 Optical Compatibility Test between Engineering Model of Laser Utilizing Communication Equipment on the Ground and the ARTEMIS Satellite in a Geostationary Earth Orbit TOYOSHIMA Morio, YAMAKAWA Shiro, YAMAWAKI Toshihi

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Source URL: www.nict.go.jp

Language: English - Date: 2013-11-21 21:11:12
960Scattering parameters / Topology / Technology / Universal Serial Bus / Meter / Electronic test equipment / Measuring instruments / Electromagnetism / Electronics / Electrical engineering

USB 3.0 Electrical Test Fixture Topologies: For more information please contact your test equipment vendor or see the Electrical Compliance Specification located at: http://www.usb.org/developers/compliance/ssusb_testing

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Source URL: www.usb.org

Language: English - Date: 2014-03-27 16:57:56
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